Items |
Specifications |
Material |
Fused Silica |
Designed Wavelength |
546.1 nm |
Designed Index |
1.46008¡À0.0005 |
Dimension Tolerance |
+0.0/-0.2 mm |
Thickness Tolerance |
¡À 0.2 mm |
Clear Aperture |
> 80% |
Parallelism |
< 3 arc minutes |
Flatness |
¦Ë/4 at 632.8 nm (Substrates) |
Surface Quality |
scratch and dig 60-40 (Substrates) |
Bevel |
0.5 (0/-0.3) mm |
Angle of incidence |
45¡ã |
Coating |
R avg ¡Ý95% @ 400¨C2000 nm |
Notes:
1. Surface Quality could reach 40-20, 20-10
2. Parallelism such as 30¡± , 10¡±, 5¡± is available.
3. Please show us the size and the coating specification. |